
FDD4N60NZ
MFR #FDD4N60NZ
FPN#FDD4N60NZ-FL
MFRonsemi
Part DescriptionPower Field-Effect Transistor, 3.4A I(D), 600V, 2.5ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252AA
Datasheet
Quote Only
Product Attributes
Main Category | Semiconductors |
Category | Discrete Semiconductors |
Sub Category | Transistors |
Family Name | FDD4N60NZ |
Packaging Type | Tape and Reel |
Packaging Quantity | 2500 |
Lifecycle Status | Obsolete |
RoHS | Compliant with Exemption |
RoHS Exemption Type | 7(a), RoHS (2015/863) |
ROHS China | Not Compliant |
Reach Status | Not Compliant |
Channel Mode | Enhancement |
Configuration | N-Channel |
Drain Source Voltage | 600V |
Drive Voltage | 10V |
FET Feature | N/R |
FET Options | N/R |
FET Type | Single |
Gate to Source Voltage | ±25V |
Input Capacitance | 510pF |
Input Capacitance Test Voltage | 25V |
Life Cycle Status | Obsolete |
Maximum Continuous Drain Current | 3.4A (Tc) |
Maximum Drain to Source Resistance | 2.5 Ohm @ 1.7A, 10V |
Maximum Gate to Source Threshold Voltage | 5V @ 250µA |
Maximum Junction Temperature | 150°C (TJ) |
Maximum Power Dissipation | 114W (Tc) |
Maximum Pulse Drain Current | 13.6A |
Maximum Total Gate Charge | 10.8nC |
Maximum Total Gate Charge Test Voltage | 10V |
Minimum Junction Temperature | -55°C (TJ) |
Package Type | TO-252 (DPAK) |
Technology | MOSFET (Metal Oxide) |
Typical Gate to Drain Charge | 3.3nC |
Typical Gate to Source Charge | 2.1nC |